Description

How it Works

1. Probe Scanning: A sharp, cantilever-mounted probe is scanned across the sample surface.
2. Force Measurement: The deflection of the cantilever is measured using a laser beam and a photodetector.
3. Image Formation: The measured forces are used to create a topographic image of the surface.

Applications of AFM

• Nanoscale Imaging: Visualizing individual atoms and molecules.
• Surface Characterization: Measuring surface roughness, topography, and morphology.
• Material Science: Studying the properties of materials at the nanoscale.
• Biochemistry: Imaging biological molecules and structures.
• Nanotechnology: Manipulating and assembling nanoscale objects.